Bulk and depth-resolved elemental composition
GD-OES
Material Analysis · Composition & Elemental
Glow Discharge Optical Emission / Mass Spectrometry (GD-OES/MS)
Characterise bulk and depth-resolved elemental composition, coating thickness and layer transitions, and trace impurities in suitable conductive or prepared samples using a scope agreed around your sample and decision.
- Price
- from£600 per sample, excl. VAT
- Turnaround
- 6 working days Preparation and scope dependent
- Available platforms
- HORIBA GD-Profiler 2Thermo Fisher ELEMENT GD PlusElement GD plus GD-MS
- Typical outputs
- Concentration-depth profileLayer thickness and interface positionsCalibration and sputter conditionsProcessed chromatogram or spectrum
Why this service
What GD-OES/MS can help you understand
Glow Discharge Optical Emission / Mass Spectrometry is selected when the project needs defensible information on bulk and depth-resolved elemental composition, coating thickness and layer transitions, or…
Coating thickness and layer transitions
GD-MS
Trace impurities in suitable conductive or prepared samples
bulk or depth-profile analysis
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
GD-OES
bulk and depth-resolved elemental composition
- Best used when
- bulk and depth-resolved elemental composition
- Typical result
- Concentration-depth profile
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
GD-MS
coating thickness and layer transitions
- Best used when
- coating thickness and layer transitions
- Typical result
- Layer thickness and interface positions
- Preparation note
- Confirm dimensions, cutting permission and whether the original geometry must be preserved.
Bulk or depth-profile analysis
trace impurities in suitable conductive or prepared samples
- Best used when
- trace impurities in suitable conductive or prepared samples
- Typical result
- Calibration and sputter conditions
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Concentration-depth profile reported with the agreed units, sample reference and measurement conditions.
Layer thickness and interface positions supplied in a labelled format suitable for direct sample or condition comparison.
Calibration and sputter conditions provided with the processing basis and quality checks agreed during technical review.
Processed chromatogram or spectrum included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Solid / component | Provide a clean, stable and clearly labelled specimen with the target face or region identified. | Confirm dimensions, cutting permission and whether the original geometry must be preserved. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
What should I send for Glow Discharge Optical Emission / Mass Spectrometry?
Provide film / coating, solid / component as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For bulk and depth-resolved elemental composition, start with GD-OES; add GD-MS when comparison or quantification is required.
How long will the test take?
Typical turnaround is 6 working days after sample acceptance and method confirmation.
What can limit the result?
Crater shape, sputter-rate conversion, and calibration influence depth accuracy. Very thin or rough layers can be difficult to resolve.
Configure the service
Send the information needed to scope GD-OES/MS correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth