Elemental and isotopic distribution
dynamic SIMS depth profiling
Material Analysis · Composition & Elemental
Nano Secondary Ion Mass Spectrometry (Nano-SIMS)
Characterise elemental and isotopic distribution, dopant or impurity depth profile, and nanoscale chemical heterogeneity using a scope agreed around your sample and decision.
- Price
- from£750 per sample, excl. VAT
- Turnaround
- 10 working days Preparation and scope dependent
- Available platforms
- CAMECA NanoSIMS 50L
- Typical outputs
- Mass spectraDepth profiles or ion mapsIsotope-ratio dataCalibrated concentration data
Why this service
What Nano-SIMS can help you understand
Nano Secondary Ion Mass Spectrometry is selected when the project needs defensible information on elemental and isotopic distribution, dopant or impurity depth profile, or nanoscale chemical…
Dopant or impurity depth profile
NanoSIMS imaging
Nanoscale chemical heterogeneity
isotope-ratio or correlative analysis
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
Dynamic SIMS depth profiling
elemental and isotopic distribution
- Best used when
- elemental and isotopic distribution
- Typical result
- Mass spectra
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
NanoSIMS imaging
dopant or impurity depth profile
- Best used when
- dopant or impurity depth profile
- Typical result
- Depth profiles or ion maps
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Isotope-ratio or correlative analysis
nanoscale chemical heterogeneity
- Best used when
- nanoscale chemical heterogeneity
- Typical result
- Isotope-ratio data
- Preparation note
- Declare volatility, corrosivity, suspended solids and any storage or temperature requirement.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Mass spectra reported with the agreed units, sample reference and measurement conditions.
Depth profiles or ion maps supplied in a labelled format suitable for direct sample or condition comparison.
Isotope-ratio data provided with the processing basis and quality checks agreed during technical review.
Calibrated concentration data included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Liquid / solution | Provide a sealed, compatible container labelled with composition, concentration and solvent. | Declare volatility, corrosivity, suspended solids and any storage or temperature requirement. |
| Solid / component | Provide a clean, stable and clearly labelled specimen with the target face or region identified. | Confirm dimensions, cutting permission and whether the original geometry must be preserved. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
What should I send for Nano Secondary Ion Mass Spectrometry?
Provide powder / particles, film / coating, liquid / solution, solid / component as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For elemental and isotopic distribution, start with dynamic SIMS depth profiling; add NanoSIMS imaging when comparison or quantification is required.
How long will the test take?
Typical turnaround is 10 working days after sample acceptance and method confirmation.
What can limit the result?
Ion yields are strongly matrix-dependent. Sputtering is destructive and can mix interfaces or alter sensitive species.
Configure the service
Send the information needed to scope Nano-SIMS correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth