Surface elemental composition and chemical state
XPS, UPS, angle-resolved XPS/ARPES
Material Analysis · Composition & Elemental
Angle-Resolved Photoelectron Spectroscopy (ARPES)
Characterise surface elemental composition and chemical state, valence-band or work-function information, and depth, angle, or momentum dependence where selected using a scope agreed around your sample and decision.
- Price
- from£300 per sample, excl. VAT
- Turnaround
- 5 working days Preparation and scope dependent
- Available platforms
- SPECS PHOIBOS 225
- Typical outputs
- Survey and high-resolution spectraPeak-fit composition and chemical-state tableOptional depth profile, valence band, work function, or ARPES band mapProcessed spectra
Why this service
What ARPES can help you understand
Angle-Resolved Photoelectron Spectroscopy is selected when the project needs defensible information on surface elemental composition and chemical state, valence-band or work-function information, or…
Valence-band or work-function information
ion or cluster depth profiling
Depth, angle, or momentum dependence where selected
in-situ heating, biasing, or gas exposure
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
XPS, UPS, angle-resolved XPS/ARPES
surface elemental composition and chemical state
- Best used when
- surface elemental composition and chemical state
- Typical result
- Survey and high-resolution spectra
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
Ion or cluster depth profiling
valence-band or work-function information
- Best used when
- valence-band or work-function information
- Typical result
- Peak-fit composition and chemical-state table
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
In-situ heating, biasing, or gas exposure
depth, angle, or momentum dependence where selected
- Best used when
- depth, angle, or momentum dependence where selected
- Typical result
- Optional depth profile, valence band, work function, or ARPES band map
- Preparation note
- Declare volatility, corrosivity, suspended solids and any storage or temperature requirement.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Survey and high-resolution spectra reported with the agreed units, sample reference and measurement conditions.
Peak-fit composition and chemical-state table supplied in a labelled format suitable for direct sample or condition comparison.
Optional depth profile, valence band, work function, or ARPES band map provided with the processing basis and quality checks agreed during technical review.
Processed spectra included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Liquid / solution | Provide a sealed, compatible container labelled with composition, concentration and solvent. | Declare volatility, corrosivity, suspended solids and any storage or temperature requirement. |
| Device / assembly | Provide a complete labelled device or assembly with drawings, interfaces and operating limits. | Confirm power, connections, operating state, access restrictions and permitted disassembly. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
What should I send for Angle-Resolved Photoelectron Spectroscopy?
Provide powder / particles, film / coating, liquid / solution, device / assembly as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For surface elemental composition and chemical state, start with XPS, UPS, angle-resolved XPS/ARPES; add ion or cluster depth profiling when comparison or quantification is required.
How long will the test take?
Typical turnaround is 5 working days after sample acceptance and method confirmation.
What can limit the result?
The method is surface-sensitive and may not represent the bulk. Charging, sputter damage, contamination, and peak-fit assumptions affect interpretation.
Configure the service
Send the information needed to scope ARPES correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth