Particles and powders
Compare particle shape, surface texture, broken particles and agglomeration.
Material Analysis · Microscopy & Imaging
Scanning Electron Microscopy (SEM) Analysis
High-resolution surface imaging for particles, coatings, fracture surfaces, pores, fibres and microstructural defects, with optional EDS elemental analysis.
- Price
- from£62 per sample, excl. VAT
- Turnaround
- 7 working days Preparation and scope dependent
- Available platforms
- ZEISS GeminiSEM 560Thermo Fisher Scientific Apreo 2TESCAN CLARAHitachi SU8010
- Typical outputs
- SEM micrographsSE and BSE imagesOptional EDS point analysisOptional EDS line scans or maps
Why this test
See the features optical microscopy misses
SEM reveals surface and near-surface features from the micrometre to nanometre scale. It is most useful when morphology, local defects or composition must be tied to a specific feature.
Fracture and failure
Inspect fracture texture, crack origins, inclusions and processing defects.
Coatings and films
Check coverage, pinholes, cracks, delamination and interface quality.
Corrosion and wear
Locate deposits, pitting, debris and surface damage linked to service conditions.
Local composition
Add EDS to identify elements at selected points, paths or mapped areas.
Choose the scope
Start from the question, not the instrument
The selected instrument, detector and preparation route depend on what you need to learn from the sample.
Surface morphology
Best for particle shape, surface texture, pores, fibres, coating coverage and fine defects.
- Recommended mode
- SE imaging, with FE-SEM for finer features
- Common outputs
- Scale-bar micrographs at agreed fields and magnifications
- Preparation note
- Non-conductive samples may need Au/Pt coating
Composition / EDS
Best for inclusions, residues, contrasting phases, coating distribution and contaminant particles.
- Recommended mode
- BSE plus EDS point, line or mapping
- Common outputs
- Spectra, semi-quantitative tables, line profiles or element maps
- Preparation note
- Carbon coating may avoid Au/Pt interference with elements of interest
Cross-section / failure
Best for fracture origins, interfaces, buried defects, diffusion zones and layered structures.
- Recommended mode
- SE / BSE imaging with optional EDS
- Common outputs
- Overview-to-detail image sequence with marked regions
- Preparation note
- Sectioning, polishing, ion milling or FIB may be required
Common outputs
A result package matched to the decision you need to make
Image count, magnifications, fields of view and file formats are confirmed before testing.
Calibrated SEM image set supplied with the agreed units, labels, sample reference and measurement conditions.
SE morphology images supplied with the agreed units, labels, sample reference and measurement conditions.
BSE contrast images supplied with the agreed units, labels, sample reference and measurement conditions.
EDS point spectra supplied with the agreed units, labels, sample reference and measurement conditions.
EDS line profiles supplied with the agreed units, labels, sample reference and measurement conditions.
Elemental maps supplied with the agreed units, labels, sample reference and measurement conditions.
Data files: image and EDS files, acquisition metadata and raw files are supplied where available and agreed in the quotation.
Example results
What SEM features can look like
Mixed particle sizes, shapes and agglomerates collected on a PTFE filter.
Akmaral Agibayeva · source · CC BY
Microvoid coalescence on a 6061-T6 aluminium tensile fracture surface.
Bob Clemintime · source · CC BY-SA
Pearlite in eutectoid steel after annealing and Nital etching.
Edward Pleshakov · source · Public domain
High-magnification view of internal microvoids within a synthetic fibre.
Innegratech · source · CC BY-SASample requirements
What to send
Dry, clean and clearly marked samples reduce avoidable preparation time and make the returned images more useful.
| Sample type | Preferred amount or size | Preparation and information required |
|---|---|---|
| Powders | 5–10 mg | Dry and sealed. State whether particles should be imaged as received or dispersed. |
| Films and bulk solids | Up to 10 × 10 × 5 mm preferred | Mark the surface, cross-section or region of interest. Larger samples require review. |
| Liquids and pastes | Method dependent | Submit only when fully dried or when drying has been agreed before testing. |
| Cross-sections | Fit to the agreed holder | Provide a clean prepared face or request sectioning, polishing, ion milling or FIB. |
| Non-conductive samples | As above | Au/Pt is commonly used for morphology; carbon may be preferable for EDS-sensitive work. |
| Special-risk samples | Advance review required | Declare magnetic, moisture-sensitive, volatile, beam-sensitive, toxic or radioactive materials. |
Vacuum compatibility: standard high-vacuum SEM is not suitable for wet or volatile samples.
Region of interest: include a marked photograph or sketch when the target feature is localised.
Questions and answers
Common SEM decisions
Short answers to the issues that most often change preparation, scope or interpretation.
Does every sample need coating?
No. Conductive and well-grounded samples may be imaged uncoated. Non-conductive samples often need a thin conductive coating to reduce charging.
Should I choose gold/platinum or carbon coating?
Au/Pt usually gives strong morphology imaging. Carbon is often chosen when metal coating peaks could interfere with EDS.
What is the difference between SE and BSE images?
SE imaging emphasises surface topography. BSE imaging is more sensitive to average atomic number and can reveal compositional or phase contrast.
What do EDS point, line and mapping mean?
Point analysis measures one location; a line profile follows change along a path; mapping shows selected element distributions across an area.
Is EDS fully quantitative?
EDS is normally semi-quantitative. Results depend on preparation, coating, geometry, matrix and concentration. Hydrogen and helium are not measured and light-element sensitivity is limited.
Can magnetic, wet or volatile samples be tested?
They require advance review. Standard high-vacuum SEM is not suitable for wet or volatile samples, and magnetic samples may be restricted by the selected instrument.
Request a quote
Send the information needed to scope SEM correctly
- Sample form, material, dimensions and quantity
- Feature or failure question to be answered
- Marked region of interest and expected feature size
- Required image modes, magnifications and EDS elements
- Coating acceptance and any sample hazards