Surface elemental composition
point analysis
Material Analysis · Composition & Elemental
Auger Electron Spectroscopy (AES)
Characterise surface elemental composition, micro-area contamination and segregation, and composition versus sputter depth using a scope agreed around your sample and decision.
- Price
- from£450 per sample, excl. VAT
- Turnaround
- 10 working days Preparation and scope dependent
- Available platforms
- ULVAC-PHI PHI 710 Scanning Auger Nanoprobe
- Typical outputs
- Auger survey and elemental spectraMicro-area maps or line scansOptional sputter depth profileProcessed spectra
Why this service
What AES can help you understand
Auger Electron Spectroscopy is selected when the project needs defensible information on surface elemental composition, micro-area contamination and segregation, or composition versus sputter depth. A…
Micro-area contamination and segregation
Auger mapping
Composition versus sputter depth
depth profiling
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
Point analysis
surface elemental composition
- Best used when
- surface elemental composition
- Typical result
- Auger survey and elemental spectra
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
Auger mapping
micro-area contamination and segregation
- Best used when
- micro-area contamination and segregation
- Typical result
- Micro-area maps or line scans
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Depth profiling
composition versus sputter depth
- Best used when
- composition versus sputter depth
- Typical result
- Optional sputter depth profile
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Auger survey and elemental spectra reported with the agreed units, sample reference and measurement conditions.
Micro-area maps or line scans supplied in a labelled format suitable for direct sample or condition comparison.
Optional sputter depth profile provided with the processing basis and quality checks agreed during technical review.
Processed spectra included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
| Solid / component | Provide a clean, stable and clearly labelled specimen with the target face or region identified. | Confirm dimensions, cutting permission and whether the original geometry must be preserved. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
What should I send for Auger Electron Spectroscopy?
Provide powder / particles, film / coating, test coupon / specimen, solid / component as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For surface elemental composition, start with point analysis; add Auger mapping when comparison or quantification is required.
How long will the test take?
Typical turnaround is 10 working days after sample acceptance and method confirmation.
What can limit the result?
Sampling depth is only a few nanometres. Electron and ion beams can damage or chemically alter sensitive materials.
Configure the service
Send the information needed to scope AES correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth