Material Analysis · Chromatography & Diagnostics

Dynamic Secondary Ion Mass Spectrometry (D-SIMS)

Characterise elemental and isotopic distribution, dopant or impurity depth profile, and nanoscale chemical heterogeneity using a scope agreed around your sample and decision.

Elemental and isotopic distribution
Dopant or impurity depth profile
Nanoscale chemical heterogeneity
Dynamic SIMS depth profiling

Configure & Book Check Sample Requirements

Representative Dynamic Secondary Ion Mass Spectrometry equipment selected for the TESTDOG service catalogue

Price: from£1500
Turnaround: 10 working days
Available platforms: Cameca IMS 7f Auto
Typical outputs: Mass spectraDepth profiles or ion mapsIsotope ratios and calibrated concentrations where standards permitProcessed chromatogram or spectrum

Why this service

What D-SIMS can help you understand

Dynamic Secondary Ion Mass Spectrometry is selected when the project needs defensible information on elemental and isotopic distribution, dopant or impurity depth profile, or nanoscale chemical…

Elemental and isotopic distribution

dynamic SIMS depth profiling

Dopant or impurity depth profile

NanoSIMS imaging

Nanoscale chemical heterogeneity

isotope-ratio or correlative analysis

Choose the scope

Start from the question, not the tool

The method, preparation route and reporting depth depend on what you need to decide.

Dynamic SIMS depth profiling

elemental and isotopic distribution

Best used when: elemental and isotopic distribution
Typical result: Mass spectra
Preparation note: Exact mass and any drying or dispersion step are confirmed after technical review.

Common outputs

A result package matched to the decision you need to make

Fields, conditions, processing and file formats are confirmed before work begins.

StandardMass spectra

Mass spectra reported with the agreed units, sample reference and measurement conditions.

StandardDepth profiles or ion maps

Depth profiles or ion maps supplied in a labelled format suitable for direct sample or condition comparison.

OptionalIsotope ratios and calibrated concentrations where standards permit

Isotope ratios and calibrated concentrations where standards permit provided with the processing basis and quality checks agreed during technical review.

OptionalProcessed chromatogram or spectrum

Processed chromatogram or spectrum included when selected in the confirmed reporting scope.

Example results

What D-SIMS results can look like

D-SIMS result: The image shows formation of flat Cu foil via SAW treatments — **Surface topography**
The image shows formation of flat Cu foil via SAW treatments.
Bo Tian et al. · source · CC BY

D-SIMS result: The plot shows high-resolution XPS spectra of the Cu–Si–O film — **Photoelectron spectrum**
The plot shows high-resolution XPS spectra of the Cu–Si–O film.
Oleh Bratus et al. · source · CC BY

D-SIMS result: The plot shows raman spectra of Cu–Si–O films formed on Si substrates — **Raman spectrum**
The plot shows raman spectra of Cu–Si–O films formed on Si substrates.
Oleh Bratus et al. · source · CC BY

D-SIMS result: The plot shows iR absorption spectra of Cu–Si–O films and SiO x films before (curve 1) and after annealing — **D-SIMS spectrum**
The plot shows iR absorption spectra of Cu–Si–O films and SiO x films before (curve 1) and after annealing.
Oleh Bratus et al. · source · CC BY

Sample requirements

What to provide before work begins

Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.

Suitable sample	Submission requirement	Planning note
Powder / particles	Provide a dry, homogeneous and clearly labelled sample in a sealed container.	Exact mass and any drying or dispersion step are confirmed after technical review.
Film / coating	Provide the coated substrate or a flat film with the test surface and coating side clearly marked.	State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Liquid / solution	Provide a sealed, compatible container labelled with composition, concentration and solvent.	Declare volatility, corrosivity, suspended solids and any storage or temperature requirement.
Solid / component	Provide a clean, stable and clearly labelled specimen with the target face or region identified.	Confirm dimensions, cutting permission and whether the original geometry must be preserved.

Objective: state the decision, comparison or acceptance criterion the work must support.

Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.

Questions and answers

Common planning decisions

Short answers to issues that can change preparation, scope, timing or interpretation.

What should I send for Dynamic Secondary Ion Mass Spectrometry?

Provide powder / particles, film / coating, liquid / solution, solid / component as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.

Which analysis option should I choose?

Choose the mode around the decision you need to make. For elemental and isotopic distribution, start with dynamic SIMS depth profiling; add NanoSIMS imaging when comparison or quantification is required.

How long will the test take?

Typical turnaround is 10 working days after sample acceptance and method confirmation.

What can limit the result?

Ion yields are strongly matrix-dependent. Sputtering is destructive and can mix interfaces or alter sensitive species.

Configure the service

Send the information needed to scope D-SIMS correctly

Sample form, material, dimensions and quantity
Feature or decision the result must address
Required comparison, acceptance criterion or reference
Preferred output and reporting depth

D-SIMS analysisfrom£1500

Typical turnaround: 10 working days

Configure & Book