Elemental depth profiling
Elemental depth profiling
Material Analysis · Composition & Elemental
Glow Discharge Optical Emission Spectrometry (GD-OES)
GD-OES elemental depth profiling for suitable coatings and solids, with layer stack, sputtering conditions and depth calibration agreed before quotation.
- Price
- from£224 per sample, excl. VATExisting family starting price, not a confirmed method-specific quotation. Method, matrix, preparation and reporting scope require review.A £45 service fee applies to orders under £300, excluding VAT.
- Turnaround
- 8–12 working days Preparation and scope dependent
- Available platforms
- HORIBA GD-Profiler 2
- Typical outputs
- Elemental signal versus sputter timeCalibrated depth profile where agreedLayer and interface observationsSputtering and calibration record
Why this service
What GD-OES can help you understand
GD-OES tracks optical emission while a glow discharge sputters the surface. This route focuses on composition changes through layers; a physical depth scale and quantitative composition require an agreed calibration.
Coating and interface comparison
Coating and interface comparison
Depth-scale calibration review
Depth-scale calibration review
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
Elemental depth profiling
Elemental depth profiling
- Best used when
- Elemental depth profiling
- Typical result
- Elemental signal versus sputter time
- Preparation note
- Depth resolution and quantification depend on roughness, interfaces, sputter rates and calibration.
Coating and interface comparison
Coating and interface comparison
- Best used when
- Coating and interface comparison
- Typical result
- Calibrated depth profile where agreed
- Preparation note
- A sputter-time trace is not automatically a calibrated concentration-versus-depth profile. Bulk ultra-trace impurity analysis is a different enquiry.
Depth-scale calibration review
Depth-scale calibration review
- Best used when
- Depth-scale calibration review
- Typical result
- Layer and interface observations
- Preparation note
- Depth resolution and quantification depend on roughness, interfaces, sputter rates and calibration.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Elemental signal versus sputter time reported with the agreed units, sample reference and measurement conditions.
Calibrated depth profile where agreed supplied in a labelled format suitable for direct sample or condition comparison.
Layer and interface observations provided with the processing basis and quality checks agreed during technical review.
Sputtering and calibration record included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Coated substrates and suitable flat solids | Identify the analysed face, substrate, coating sequence and expected layer thicknesses. | Depth resolution and quantification depend on roughness, interfaces, sputter rates and calibration. |
| Coated substrates and suitable flat solids | List target elements, required depth range and available reference materials. | A sputter-time trace is not automatically a calibrated concentration-versus-depth profile. Bulk ultra-trace impurity analysis is a different enquiry. |
| Coated substrates and suitable flat solids | State dimensions, conductivity, surface roughness and permission to create a sputter crater. | Depth resolution and quantification depend on roughness, interfaces, sputter rates and calibration. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
Is sputter time the same as depth?
No. Converting time to depth needs an accepted sputter-rate or crater-depth calibration; different layers can erode at different rates.
Will the surface be damaged?
Yes. Glow-discharge sputtering removes material and leaves a crater. Agree the analysed area and acceptable damage before testing.
Configure the service
Send the information needed to scope GD-OES correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth
GD-OES analysisfrom£224
A £45 service fee applies to orders under £300, excluding VAT.
Typical turnaround: 8–12 working days
Configure & Book