Film and multilayer thickness
single-layer or multilayer fitting
Material Analysis · Structure & Spectroscopy
X-ray Reflectivity (XRR)
Characterise film and multilayer thickness, electron density or mass-density contrast, and surface and interface roughness using a scope agreed around your sample and decision.
- Price
- from£90 per sample, excl. VAT
- Turnaround
- 5 working days Preparation and scope dependent
- Available platforms
- Bruker D8 DISCOVER PlusMalvern Panalytical EmpyreanRigaku SmartLab
- Typical outputs
- Reflectivity curveBest-fit layer modelThickness, density, and roughness parameters with fit qualityProcessed spectra
Why this service
What XRR can help you understand
X-ray Reflectivity is selected when the project needs defensible information on film and multilayer thickness, electron density or mass-density contrast, or surface and interface roughness. Specular…
Electron density or mass-density contrast
off-specular or diffuse scattering
Surface and interface roughness
combined XRR and HRXRD
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
Single-layer or multilayer fitting
film and multilayer thickness
- Best used when
- film and multilayer thickness
- Typical result
- Reflectivity curve
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Off-specular or diffuse scattering
electron density or mass-density contrast
- Best used when
- electron density or mass-density contrast
- Typical result
- Best-fit layer model
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Combined XRR and HRXRD
surface and interface roughness
- Best used when
- surface and interface roughness
- Typical result
- Thickness, density, and roughness parameters with fit quality
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
Reflectivity curve reported with the agreed units, sample reference and measurement conditions.
Best-fit layer model supplied in a labelled format suitable for direct sample or condition comparison.
Thickness, density, and roughness parameters with fit quality provided with the processing basis and quality checks agreed during technical review.
Processed spectra included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
What should I send for X-ray Reflectivity?
Provide film / coating, test coupon / specimen as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For film and multilayer thickness, start with single-layer or multilayer fitting; add off-specular or diffuse scattering when comparison or quantification is required.
How long will the test take?
Typical turnaround is 5 working days after sample acceptance and method confirmation.
What can limit the result?
Fits can be non-unique, especially for complex stacks. Rough, graded, curved, or laterally non-uniform films reduce sensitivity.
Configure the service
Send the information needed to scope XRR correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth