Surface topography and roughness
contact, tapping, or non-contact imaging
Material Analysis · Microscopy & Imaging
Atomic Force Microscopy (AFM)
Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and distribution using a scope agreed around your sample and decision.
- Price
- from£87 per sample, excl. VAT
- Turnaround
- 7 working days Preparation and scope dependent
- Available platforms
- Bruker Dimension IconAsylum Research Cypher VRS1250Shimadzu SPM-9700Agilent 5500
- Typical outputs
- Height and phase/property mapsLine profiles and roughness statisticsAcquisition settings and representative raw dataMethod-specific images
Why this test
What AFM can help you understand
Atomic Force Microscopy is selected when the project needs defensible information on surface topography and roughness, local mechanical, electrical, or capacitance contrast, or feature height, width, and distribution.…
Local mechanical, electrical, or capacitance contrast
electrical or capacitance mapping
Feature height, width, and distribution
force spectroscopy or quantitative nanomechanical mapping
Choose the scope
Start from the question, not the instrument
The measurement mode, preparation route and reporting depth depend on what you need to learn from the sample.
Contact, tapping, or non-contact imaging
surface topography and roughness
- Best used when
- surface topography and roughness
- Typical result
- Height and phase/property maps
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
Electrical or capacitance mapping
local mechanical, electrical, or capacitance contrast
- Best used when
- local mechanical, electrical, or capacitance contrast
- Typical result
- Line profiles and roughness statistics
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Force spectroscopy or quantitative nanomechanical mapping
feature height, width, and distribution
- Best used when
- feature height, width, and distribution
- Typical result
- Acquisition settings and representative raw data
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Common outputs
A result package matched to the decision you need to make
Fields, measurement conditions, processing and file formats are confirmed before work begins.
Height and phase/property maps reported with the agreed units, sample reference and measurement conditions.
Line profiles and roughness statistics supplied in a labelled format suitable for direct sample or condition comparison.
Acquisition settings and representative raw data provided with the processing basis and quality checks agreed during technical review.
Method-specific images included when selected in the confirmed reporting scope.
Example results
What AFM results can look like
The map shows topographic AFM images of mechanically polished and chemical-mechanical polished wafer surfaces, with colour scales showing.
Cristiano Albonetti et al. · source · CC BY
Topographic AFM images of polymeric films prepared on polished substrates by spin-coating, drop-casting and casting.
Cristiano Albonetti et al. · source · CC BYSample requirements
What to send
Provide representative, clearly labelled samples and identify the region, feature or comparison that matters.
| Suitable sample or input | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
| Solid / component | Provide a clean, stable and clearly labelled specimen with the target face or region identified. | Confirm dimensions, cutting permission and whether the original geometry must be preserved. |
Region of interest: include a marked image, sketch or reference when the target feature is localised.
Handling: declare hazardous, magnetic, volatile, moisture-sensitive, beam-sensitive or temperature-controlled material before dispatch.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope or interpretation.
What should I send for Atomic Force Microscopy?
Provide powder / particles, film / coating, test coupon / specimen, solid / component as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For surface topography and roughness, start with contact, tapping, or non-contact imaging; add electrical or capacitance mapping when comparison or quantification is required.
How long will the test take?
Typical turnaround is 7 working days after sample acceptance and method confirmation.
What can limit the result?
Tip shape and feedback settings broaden small features. The scanned area is small and may not represent a heterogeneous bulk sample.
Configure the service
Send the information needed to scope AFM correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Marked region of interest where relevant
- Required comparison, output and reporting depth