Microscopy & Imaging
Microscopy & Imaging services within Material Analysis, organised around the evidence, outputs and decisions described in the TESTDOG catalogue.
Direct microscopy routes
Start with SEM, TEM/STEM or FIB-SEM
Material Analysis
Microscopy & Imaging
3D Optical Scanning (3D Scan)Characterise full-field surface geometry, nominal-to-actual deviation, and dimensions, warpage, and local defects using a scope…→AFM-Infrared Spectroscopy (AFM-IR)Characterise nanoscale chemical identity, topography and local mechanical response, and chemical-domain size and distribution using a…→Atomic Force Microscopy (AFM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Computed Tomography (Industrial / Micro-Nano / In-situ / Synchrotron CT)Characterise internal geometry and density contrast, pores, cracks, inclusions, interfaces, and connectivity, and three-dimensional…→Confocal Laser Scanning Microscopy (CLSM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Correlative SEM-Raman AnalysisCharacterise morphology and microstructure, molecular or crystalline Raman identity, and elemental or molecular-ion distribution…→Correlative SEM-Raman-FIB-TOF-SIMSCharacterise morphology and microstructure, molecular or crystalline Raman identity, and elemental or molecular-ion distribution…→Cryogenic Scanning Electron Microscopy (Cryo-SEM)Characterise frozen-state morphology and ultrastructure, interfaces, pores, particles, and fracture faces, and optional elemental or…→Cryogenic TEM with Cryo-FIB Preparation (Cryo-TEM)Characterise frozen-state morphology and ultrastructure, interfaces, pores, particles, and fracture faces, and optional elemental or…→Electron Backscatter Diffraction (EBSD)Characterise crystal orientation and texture, grain size and boundary character, and phase distribution and local misorientation…→Electron Channelling Contrast Imaging (ECCI)Characterise dislocation structures and density trends, grain and sub-grain contrast, and near-surface deformation and defects using…→Extended-Depth-of-Field 3D Microscopy (3D-EDF)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Fluorescence Microscopy (FM)Characterise fluorescence intensity and spatial distribution, co-localisation, feature size, and area fraction, and time-,…→Focused Ion Beam SEM and Cross-Section Analysis (FIB-SEM)Characterise buried interfaces and layer thickness, site-specific defects, pores, and microstructure, and three-dimensional or…→High-Speed Imaging (HSI)Characterise position, velocity, and acceleration, event timing and deformation sequence, and crack, impact, spray, flow, or…→Infrared Thermal Imaging (IRT)Characterise surface temperature distribution, heating and cooling rates, and hot spots, thermal gradients, and transient response…→Laser Scanning Microscopy (LSM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Lorentz Transmission Electron Microscopy (Lorentz TEM)Characterise crystal structure, defects, and interfaces, particle size and lattice spacing, and nanoscale elemental or chemical…→Micro-LED Wafer AOI InspectionCharacterise defect location and class, feature dimensions and placement, and wafer-level yield and spatial defect distribution using…→Mineral Liberation Analysis (MLA)Characterise mineral abundance, liberation and locking, and grain size, association, and particle composition using a scope agreed…→Optical / Metallographic Microscopy (OM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Polarised Light Microscopy / Petrography (PLM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Scanning Capacitance Microscopy (SCM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Scanning Electrochemical Microscopy (SECM)Characterise local redox activity, reaction-rate and transport contrast, and electrochemical heterogeneity across a surface using a…→Scanning Electron Microscopy (SEM / FESEM / ESEM / In-situ)Characterise surface morphology and feature size, topographic and compositional contrast, and local defects, particles, coatings,…→Scanning Tunneling Microscopy (STM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Stereo Microscopy (Stereo OM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Terahertz 3D Tomographic Imaging (THz Tomography)Characterise internal geometry and density contrast, pores, cracks, inclusions, interfaces, and connectivity, and three-dimensional…→Transmission / Scanning Transmission Electron Microscopy (TEM/STEM)Characterise crystal structure, defects, and interfaces, particle size and lattice spacing, and nanoscale elemental or chemical…→White-Light Interferometric 3D Profilometry (WLI)Characterise surface topography, step height and form, and areal roughness and volume parameters using a scope agreed around your…→
Not sure which route fits?