Which deep-level traps are present?
Conventional DLTS spectrum
Performance Testing · Electrical & Electrochemical
Deep-Level Transient Spectroscopy (DLTS)
Identify electrically active defects in semiconductor junctions and estimate their activation energy, capture cross-section and concentration.
- Price
- from£35 per sample, excl. VAT
- Turnaround
- 10 working days Preparation and scope dependent
- Available platforms
- Semilab DLS-1100
- Typical outputs
- DLTS spectrum versus temperatureActivation energy and capture cross-sectionEstimated trap concentrationBias, pulse and rate-window conditions
Why this service
What DLTS can help you understand
DLTS records capacitance transients while a semiconductor junction is pulsed and temperature is scanned. It is used to separate deep-level defects that conventional current-voltage measurements cannot…
How do defect populations change after processing or ageing?
Temperature-window comparison
Are traps likely to limit carrier lifetime or device performance?
Defect parameter extraction
Choose the scope
Start from the question, not the tool
The method, preparation route and reporting depth depend on what you need to decide.
Conventional DLTS spectrum
Which deep-level traps are present?
- Best used when
- Which deep-level traps are present?
- Typical result
- DLTS spectrum versus temperature
- Preparation note
- Declare biological hazards and confirm fixation, dehydration, temperature and disposal requirements.
Temperature-window comparison
How do defect populations change after processing or ageing?
- Best used when
- How do defect populations change after processing or ageing?
- Typical result
- Activation energy and capture cross-section
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Defect parameter extraction
Are traps likely to limit carrier lifetime or device performance?
- Best used when
- Are traps likely to limit carrier lifetime or device performance?
- Typical result
- Estimated trap concentration
- Preparation note
- Confirm power, connections, operating state, access restrictions and permitted disassembly.
Common outputs
A result package matched to the decision you need to make
Fields, conditions, processing and file formats are confirmed before work begins.
DLTS spectrum versus temperature reported with the agreed units, sample reference and measurement conditions.
Activation energy and capture cross-section supplied in a labelled format suitable for direct sample or condition comparison.
Estimated trap concentration provided with the processing basis and quality checks agreed during technical review.
Bias, pulse and rate-window conditions included when selected in the confirmed reporting scope.
Sample requirements
What to provide before work begins
Provide representative, clearly labelled samples and identify the decision, feature or comparison that matters.
| Suitable sample | Submission requirement | Planning note |
|---|---|---|
| Biological / soft material | Provide fixed, preserved or otherwise stabilised material in the agreed container and medium. | Declare biological hazards and confirm fixation, dehydration, temperature and disposal requirements. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
| Device / assembly | Provide a complete labelled device or assembly with drawings, interfaces and operating limits. | Confirm power, connections, operating state, access restrictions and permitted disassembly. |
Objective: state the decision, comparison or acceptance criterion the work must support.
Handling and access: declare hazards, instability, confidentiality, file constraints or special logistics before dispatch or transfer.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope, timing or interpretation.
Does DLTS work on an uncontacted wafer?
Usually no. A suitable rectifying or p-n junction and reliable electrical contacts are required.
What is the typical turnaround?
Typical turnaround is 10 working days after sample acceptance and method confirmation.
Configure the service
Send the information needed to scope DLTS correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Required comparison, acceptance criterion or reference
- Preferred output and reporting depth