Morphology and microstructure
SEM-Raman
Material Analysis · Microscopy & Imaging
Correlative SEM-Raman-FIB-TOF-SIMS
Characterise morphology and microstructure, molecular or crystalline Raman identity, and elemental or molecular-ion distribution across the same feature using a scope agreed around your sample and decision.
- Price
- from£300 per sample, excl. VAT
- Turnaround
- 7 working days Preparation and scope dependent
- Available platforms
- WITec RISE alpha300 apyronHORIBA LabRAM OdysseyRenishaw inVia Qontor
- Typical outputs
- Registered SEM and Raman mapsCorrelative overlaysOptional FIB cross-section and TOF-SIMS ion mapsMethod-specific images
Why this test
What SEM-Raman/FIB-TOF-SIMS can help you understand
Correlative SEM-Raman-FIB-TOF-SIMS is selected when the project needs defensible information on morphology and microstructure, molecular or crystalline Raman identity, or elemental or molecular-ion distribution across…
Molecular or crystalline Raman identity
SEM-Raman plus FIB cross-section
Elemental or molecular-ion distribution across the same feature
full SEM-Raman-FIB-TOF-SIMS workflow
Choose the scope
Start from the question, not the instrument
The measurement mode, preparation route and reporting depth depend on what you need to learn from the sample.
SEM-Raman
morphology and microstructure
- Best used when
- morphology and microstructure
- Typical result
- Registered SEM and Raman maps
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
SEM-Raman plus FIB cross-section
molecular or crystalline Raman identity
- Best used when
- molecular or crystalline Raman identity
- Typical result
- Correlative overlays
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Full SEM-Raman-FIB-TOF-SIMS workflow
elemental or molecular-ion distribution across the same feature
- Best used when
- elemental or molecular-ion distribution across the same feature
- Typical result
- Optional FIB cross-section and TOF-SIMS ion maps
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Common outputs
A result package matched to the decision you need to make
Fields, measurement conditions, processing and file formats are confirmed before work begins.
Registered SEM and Raman maps reported with the agreed units, sample reference and measurement conditions.
Correlative overlays supplied in a labelled format suitable for direct sample or condition comparison.
Optional FIB cross-section and TOF-SIMS ion maps provided with the processing basis and quality checks agreed during technical review.
Method-specific images included when selected in the confirmed reporting scope.
Sample requirements
What to send
Provide representative, clearly labelled samples and identify the region, feature or comparison that matters.
| Suitable sample or input | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
| Device / assembly | Provide a complete labelled device or assembly with drawings, interfaces and operating limits. | Confirm power, connections, operating state, access restrictions and permitted disassembly. |
Region of interest: include a marked image, sketch or reference when the target feature is localised.
Handling: declare hazardous, magnetic, volatile, moisture-sensitive, beam-sensitive or temperature-controlled material before dispatch.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope or interpretation.
What should I send for Correlative SEM-Raman-FIB-TOF-SIMS?
Provide powder / particles, film / coating, test coupon / specimen, device / assembly as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
Choose the mode around the decision you need to make. For morphology and microstructure, start with SEM-Raman; add SEM-Raman plus FIB cross-section when comparison or quantification is required.
How long will the test take?
Typical turnaround is 7 working days after sample acceptance and method confirmation.
What can limit the result?
Registration accuracy and different sampling depths must be considered. The complete workflow is slower and more destructive than a single technique.
Configure the service
Send the information needed to scope SEM-Raman/FIB-TOF-SIMS correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Marked region of interest where relevant
- Required comparison, output and reporting depth