Structural analysis guides

• TEM Analysis

  Uses transmission electron microscopy to examine nanoscale structure, particles, interfaces and crystal features.

  Microscopy & Imaging

• FIB Preparation

  Uses focused ion beam preparation for site-specific cross-sections, TEM lamellae or micro-scale material removal.

  Service overview

• EDS Analysis

  Identifies local elemental composition using energy-dispersive X-ray spectroscopy, often alongside SEM imaging.

  Service overview

• Optical Microscopy

  Uses optical imaging to examine surface features, microstructure, cracks, inclusions or prepared cross-sections.

  Microscopy & Imaging

• Micro-CT Scanning

  Provides non-destructive 3D inspection of internal features, porosity, cracks and geometry.

  Microscopy & Imaging