Crystal structure, defects, and interfaces
bright-field, dark-field, HRTEM, HAADF-STEM
Material Analysis · Microscopy & Imaging
Lorentz Transmission Electron Microscopy (Lorentz TEM)
Characterise crystal structure, defects, and interfaces, particle size and lattice spacing, and nanoscale elemental or chemical distribution using a scope agreed around your sample and decision.
- Price
- from£450 per sample, excl. VAT
- Turnaround
- 6 working days Preparation and scope dependent
- Available platforms
- JEOL GRAND ARM2Thermo Fisher Spectra UltraHitachi HF5000
- Typical outputs
- TEM/STEM image seriesSelected-area or nanobeam diffractionOptional EDS/EELS maps and lattice measurementsMethod-specific images
Why this test
What Lorentz TEM can help you understand
Lorentz Transmission Electron Microscopy is selected when the project needs defensible information on crystal structure, defects, and interfaces, particle size and lattice spacing, or nanoscale elemental or chemical…
Particle size and lattice spacing
diffraction, tomography, EDS, or EELS
Nanoscale elemental or chemical distribution
Lorentz imaging for magnetic structures
Choose the scope
Start from the question, not the instrument
The measurement mode, preparation route and reporting depth depend on what you need to learn from the sample.
Bright-field, dark-field, HRTEM, HAADF-STEM
crystal structure, defects, and interfaces
- Best used when
- crystal structure, defects, and interfaces
- Typical result
- TEM/STEM image series
- Preparation note
- Exact mass and any drying or dispersion step are confirmed after technical review.
Diffraction, tomography, EDS, or EELS
particle size and lattice spacing
- Best used when
- particle size and lattice spacing
- Typical result
- Selected-area or nanobeam diffraction
- Preparation note
- State the substrate, nominal thickness and whether sectioning or mounting is permitted.
Lorentz imaging for magnetic structures
nanoscale elemental or chemical distribution
- Best used when
- nanoscale elemental or chemical distribution
- Typical result
- Optional EDS/EELS maps and lattice measurements
- Preparation note
- Confirm the applicable standard, dimensions, loading direction and number of replicates.
Common outputs
A result package matched to the decision you need to make
Fields, measurement conditions, processing and file formats are confirmed before work begins.
TEM/STEM image series reported with the agreed units, sample reference and measurement conditions.
Selected-area or nanobeam diffraction supplied in a labelled format suitable for direct sample or condition comparison.
Optional EDS/EELS maps and lattice measurements provided with the processing basis and quality checks agreed during technical review.
Method-specific images included when selected in the confirmed reporting scope.
Sample requirements
What to send
Provide representative, clearly labelled samples and identify the region, feature or comparison that matters.
| Suitable sample or input | Submission requirement | Planning note |
|---|---|---|
| Powder / particles | Provide a dry, homogeneous and clearly labelled sample in a sealed container. | Exact mass and any drying or dispersion step are confirmed after technical review. |
| Film / coating | Provide the coated substrate or a flat film with the test surface and coating side clearly marked. | State the substrate, nominal thickness and whether sectioning or mounting is permitted. |
| Test coupon / specimen | Provide labelled specimens prepared to the agreed geometry, orientation and surface condition. | Confirm the applicable standard, dimensions, loading direction and number of replicates. |
Region of interest: include a marked image, sketch or reference when the target feature is localised.
Handling: declare hazardous, magnetic, volatile, moisture-sensitive, beam-sensitive or temperature-controlled material before dispatch.
Questions and answers
Common planning decisions
Short answers to issues that can change preparation, scope or interpretation.
What should I send for Lorentz Transmission Electron Microscopy?
Provide powder / particles, film / coating, test coupon / specimen as applicable. Exact quantity, dimensions and preparation are confirmed during technical review.
Which analysis option should I choose?
The final method, preparation and reporting scope are confirmed after the sample and project objective have been reviewed.
How long will the test take?
Typical turnaround is 6 working days after sample acceptance and method confirmation.
What can limit the result?
Preparation is demanding and local. Beam damage, thickness, overlap, and projection effects can complicate interpretation.
Configure the service
Send the information needed to scope Lorentz TEM correctly
- Sample form, material, dimensions and quantity
- Feature or decision the result must address
- Marked region of interest where relevant
- Required comparison, output and reporting depth