Atomic- or nanoscale surface topography
Assess atomic- or nanoscale surface topography as part of a lab-ready investigation scope.
Material Testing · Microscopy & Imaging
Scanning Tunneling Microscopy (STM) Analysis
- Instrument model
- STM-capable scanning probe microscopy systems for conductive or semiconductive surfaces
- Typical turnaround
- 7-15 working days
- Common outputs
- STM topography imagesnanoscale surface feature profilesimaging-condition notes
- Price from
- Request quote
Overview & applications
When to use STM in an engineering investigation
STM helps engineering and research teams investigate atomic- or nanoscale surface topography, surface defects, steps, terraces, and local electronic contrast, conductive surface behaviour under controlled imaging conditions with a lab-ready scope. TESTDOG can help translate an unclear request into the right imaging route, sample preparation notes and reporting requirements.
Use this page as a starting point for deciding whether STM is suitable before requesting a quotation.
What this test can help you understand
Surface defects, steps, terraces, and
Assess surface defects, steps, terraces, and local electronic contrast as part of a lab-ready investigation scope.
Conductive surface behaviour under controlled
Assess conductive surface behaviour under controlled imaging conditions as part of a lab-ready investigation scope.
Samples & requirements
Suitable samples and what to prepare
Typical sample types
- Conductive or semiconductive flat surfaces
- Thin films, crystals, 2D materials, and prepared nanomaterials
- Samples compatible with the required environment and mounting
Submission requirements
- Samples must be conductive or semiconductive, flat, clean, and stable under the required imaging environment
- Loose powders, insulating surfaces, rough surfaces, or contaminated samples are normally unsuitable without special preparation
- Provide target scan size, desired resolution, substrate information, and any air-sensitive handling requirements
Available options and related modes
STM routes we can help coordinate
Ambient STM
Ambient STM can be scoped where the sample, objective and partner capability are suitable.
Conductive surface imaging
Conductive surface imaging can be scoped where the sample, objective and partner capability are suitable.
Atomic / nanoscale topography
Atomic / nanoscale topography can be scoped where the sample, objective and partner capability are suitable.
SPM comparison with AFM
SPM comparison with AFM can be scoped where the sample, objective and partner capability are suitable.
Deliverables
What you can expect back
01STM topography images
STM topography images.
02Feature-height or profile information where
Feature-height or profile information where requested.
03Basic imaging notes
Basic imaging notes.
Final deliverables depend on sample condition, selected mode, instrument access and the agreed reporting scope.